Overlapping photoelectron lines and Auger features are a common issue in the analysis of complex materials. The standard approach of switching to an achromatic Mg X-ray source may become undesirable ...
X ray spectrometry techniques are nowadays widely used in many analytical applications. The different interactions of x rays with matter have served to provide useful information for comprehensive ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results