PARIS — Synopsys Inc. announced that STMicroelectronics NV has selected Synopsys' TetraMAX small delay defect (SDD) automatic test pattern generation (ATPG) and failure diagnostics solution in order ...
Mountain View, CA. Synopsys Inc. at ITC announced a new, breakthrough ATPG and diagnostics technology that delivers 10X faster run time and 25% fewer test patterns to shorten schedules, accelerate ...
Growing pressure to improve IC reliability in safety- and mission-critical applications is fueling demand for custom automated test pattern generation (ATPG) to detect small timing delays, and for ...
As semiconductor devices advance in complexity and sensitivity to power fluctuations, the integration of power-aware automatic test pattern generation (ATPG) is becoming indispensable for yield and ...
Rahul Singhal is a Product Manager for TestMAX DFT at Synopsys. His focus is on the industry requirements in the area of test compression, ATPG, and DFT for AI architectures. He developed and ...
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