The most common solders are tin-lead alloys with low melting points. Their high-quality cross-section for SEM and EPMA and thin films for TEM are difficult to be prepared using ion beam milling. This ...

In the single-beam FIB, such as our Hitachi FB-2000A FIB, some milling will occur during observation of the specimen. Surface features, such as thin films, can be milled away during this process. In ...

The significance of histological examination in the classification and diagnosis of clinical conditions is reliant on the expertise of the histology laboratory in managing the wide spectrum of ...

The FIB is a highly effective piece of technology that can accelerate the specimen preparation processes for use in a SEM or a TEM through the application of its micro-machining, sectioning, and ...

Japanese scientists report in Pattern Recognition a new method to construct 3D models from 2D images. The approach, which involves non-rigid registration with a blending of rigid transforms, overcomes ...