Over the past decade, demand for nano-electrical characterization has rapidly increased due to the continuous miniaturization of electronic devices. The semiconductor and microelectronics industries ...

Santa Rosa, CA. Keysight Technologies today announced the third generation of its P9000 Series massively parallel parametric test system. The system accelerates the fast ramp of new technology and ...

Norwood, Mass. — Analog Devices, Inc.'s new families of capacitance-to-digital converters (CDCs) and impedance-to-digital converters (IDCs) simplify instrumentation and sensor design in industrial, ...

Capacitance-voltage (C-V) testing is widely used to determine semiconductor parameters, particularly in MOSCAP and MOSFET structures. However, other types of semiconductor devices and technologies ...

Depending upon the distance between the surface of a capacitance probe and a target source, the electrical capacitance that is formed between these two objects will vary. In an effort to improve ...

High-voltage capacitance-voltage (HV C-V) measurements are an increasingly important for characterizing the latest generation of wide-bandgap power semiconductor devices because the measurements are ...