Analog fault simulation in mixed‐signal circuits is a critical tool for ensuring the robustness and reliability of systems that integrate both analogue and digital components. This field addresses the ...

The RISC-V open standard ISA (Instruction Set Architecture) offers developers the opportunity to configure the features and functions of a custom processor to uniquely address their target end ...

Power Hardware-in-the-Loop (PHIL) simulation and testing is a cutting-edge methodology that integrates actual power system components with high-fidelity computational models. This approach creates a ...

How the challenges of electric-motor control design can be overcome using digital twins in all design and test phases. How automated testing within a continuous and integrated toolchain is able to ...

ATPG targets faults at IC-gate boundaries, but 50% of defects are located within cells. Learn how cell-aware ATPG and user-defined fault models help to ferret out these hard-to-squash bugs.

Decoupling application logic from hardware lets engineers test firmware on host machines instead of waiting for dev boards.