As well as being an extremely effective standalone tool for thermomicrometric sample analysis, Linkam stages are frequently used to add temperature and environmental control to a variety of ...

Imaging spectroscopic ellipsometry delivers nanometer-level sensitivity and spatial resolution, addressing the limitations of conventional metrology techniques.

a, Schematics of a conventional spectroscopic ellipsometry system. b, Schematics of a metasurface array-based single-shot spectroscopic ellipsometry system. The metasurface array-based system for ...

Artificial intelligence is one of the driving forces in today’s semiconductor industry, with more traditional market drivers like high performance compute and smart phones continuing to play important ...

Scientists measured single MXene flakes with light-based micro-ellipsometry, uncovering unique conductivity and optical traits for smarter energy and electronics. (Nanowerk News) Researchers have for ...

One of the biggest challenges for nanoscale fabrication is how to measure devices on such a minute scale. As the semiconductor industry demands ever smaller devices, the need for reliable, robust ...