Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing devices can be identified and separated prior to packaging. Test infrastructure ...

An integrated optoelectronic system aims to streamline high-volume testing for next-gen AI-driven data centre interconnects.

CLEVELAND--(BUSINESS WIRE)--Keithley Instruments, Inc., a world leader in advanced electrical test instruments and systems, has introduced a variety of enhancements for its award-winning Model ...

Are your environmental test results exposing true device weaknesses, or just reflecting extreme stress conditions?

Congratulations to alumnus Bryan Root (ElEngr’84), who was recently elevated to Institute of Electrical and Electronics Engineers Fellow for leadership in improving semiconductor reliability test ...

Hidden semiconductor defects often pass inspection but fail later in operation. Learn how latent defects form, evade ...

Final electrical test remains one of the best ways to assess a circuit’s ultimate viability. But we know that, unfortunately, even 100% end-of-line electrical testing of semiconductor wafers will not ...

FormFactor (FORM) is a $2.5 billion OEM of automated wafer probe cards and other testing devices used in the back-end portion of the semiconductor manufacturing process. FORM serves the requirements ...

Keithley Instruments announces the newest release of hardware and software advances for its award-winning Model 4200-SCS Semiconductor Characterization System, representing the next step in pulse test ...

AI workloads require rapid access to vast amounts of data, made possible by integrating HBMs. This approach, combining two, ...

Mark Jagiela joined Teradyne in 1982 as a design engineer, developing image-sensor test systems. In 1989, he moved to Tokyo and served as GM of Teradyne's Japan Division. He returned to the US in 1999 ...