Researchers discovered that crystal dislocations in antiferroelectric PbZrO3 thin films generate ordered polar antihedgehog lattices, creating a new defect-engineering approach for polar topologies.

The latest studies using CRAIC Technologies’ microspectroscopy have delivered important insights into the characterization of semiconductors and other new materials. The advanced abilities of CRAIC ...

Nanoindenters are precise, adaptable, and user-friendly tools for performing nanoscale mechanical testing on various films and surfaces. Nanoindentation systems with electromagnetic actuation achieve ...

Scientists can now create and control tiny internal defects in ultra-thin materials, enabling new properties and potential breakthroughs in nanotechnology. (Nanowerk News) Materials scientists at the ...

Researchers in China have developed an electrical imaging technique using three-dimensional (3D) tomographic conductive atomic force microscopy (TC-AFM) to go beyond indirect characterization of ...

Yield loss is increasingly driven by molecular variability in thin films, interfaces, and contamination rather than visible defects. Reliability issues often appear first as parametric drift or margin ...

This study constitutes a demonstration of highly textured, large-area perovskite photodiodes integrated sturdily onto FTO substrates and paves. CHENGDU, SICHUAN ...